Cypress Semiconductor /psoc63 /FLASHC /FM_CTL /TEST_CTL

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Interpret as TEST_CTL

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0TEST_MODE0 (PN_CTL)PN_CTL 0 (TM_PE)TM_PE 0 (TM_DISPOS)TM_DISPOS 0 (TM_DISNEG)TM_DISNEG 0 (EN_CLK_MON)EN_CLK_MON 0 (CSL_DEBUG)CSL_DEBUG 0 (ENABLE_OSC)ENABLE_OSC 0 (UNSCRAMBLE_WA)UNSCRAMBLE_WA

Description

Test mode control

Fields

TEST_MODE

Test mode control: ‘0’-‘31’: TBD

PN_CTL

Postive/negative margin mode control: ‘0’: negative margin control ‘1’: positive margin control

TM_PE

PUMP_EN override: Pump Enable =PUMP_EN | PE_TM

TM_DISPOS

Test mode positive pump disable

TM_DISNEG

Test mode negative pump disable

EN_CLK_MON

1: enables the oscillator output monitor

CSL_DEBUG

Engineering Debug Register

ENABLE_OSC

0’: the oscillator enable logic has control over the internal oscillator ‘1’: forces oscillator enable HI

UNSCRAMBLE_WA

See BSN-242 memo ‘0’: normal ‘1’: disables the Word Address scrambling

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